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Test to Determine Sensitivity of Electronic Components to Ultrasonic Energy

contributor authorIPC - Association Connecting Electronics Industries
date accessioned2017-09-04T17:16:04Z
date available2017-09-04T17:16:04Z
date copyright01/01/1995
date issued1995
identifier otherZETTCAAAAAAAAAAA.pdf
identifier urihttps://lib.yabesh.ir/std/handle/yse/139470
description abstractThe purpose of this test method is to provide a consistent procedure to test the sensitivity of electronic components to ultrasonic energy. There has been reluctance in the electronics industry to use ultrasonic energy for printed board assembly cleaning because of the possibility of damage to wire bonds in active, hermetically sealed components or other damage that might cause latent failures. Recent work has shown that electronic components have a low potential for damage from ultrasonics (References 1-7) under conditions seen in most cleaning processes. In addition, MIL-STD-2000 Rev. A and J-STD-001 now allow for the use of ultrasonic cleaning, as does the proposal for IEC TC91 International Standards based on an updated revision of the J-STD-001.
languageEnglish
titleIPC TM-650 2.6.9.2num
titleTest to Determine Sensitivity of Electronic Components to Ultrasonic Energyen
typestandard
page4
statusActive
treeIPC - Association Connecting Electronics Industries:;1995
contenttypefulltext


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