درباره ما
IPC 9261A
In-Process DPMO and Estimated Yield for PCAs
| contributor author | IPC - Association Connecting Electronics Industries | |
| date accessioned | 2017-09-04T17:52:55Z | |
| date available | 2017-09-04T17:52:55Z | |
| date copyright | 38991 | |
| date issued | 2006 | |
| identifier other | FDDRXBAAAAAAAAAA.pdf | |
| identifier uri | https://lib.yabesh.ir/std/handle/yse/176092 | |
| description abstract | This document defines standard methodologies for calculating defects per million opportunities (DPMO) metrics related to electronic printed board assembly processes. It is intended for use in measuring in-process assembly steps rather than end product determination. Calculation of completed item DPMO is addressed in IPC-7912. Additionally, a guide to defect categorization is provided that when used with J-STD-001 and IPC-A-610 can serve as a base for summarizing and reporting in-process defects. Note: This document does not dictate the number of assemblies or data points needed to calculate DPMO metrics. | |
| language | English | |
| title | IPC 9261A | num |
| title | In-Process DPMO and Estimated Yield for PCAs | en |
| type | standard | |
| page | 24 | |
| status | Active | |
| tree | IPC - Association Connecting Electronics Industries:;2006 | |
| contenttype | fulltext |
