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Conductive Anodic Filament (CAF) Resistance Test: X-Y Axis

contributor authorIPC - Association Connecting Electronics Industries
date accessioned2017-09-04T18:13:58Z
date available2017-09-04T18:13:58Z
date copyright05/01/2012
date issued2012
identifier otherHGLMGFAAAAAAAAAA.pdf
identifier urihttps://lib.yabesh.ir/std/handle/yse/196941
languageEnglish
titleIPC TM-650 2.6.25Anum
titleConductive Anodic Filament (CAF) Resistance Test: X-Y Axisen
typestandard
page11
statusActive
treeIPC - Association Connecting Electronics Industries:;2012
contenttypefulltext


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