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Supporting Data and Numerical Examples for ANSI/J-STD-001B: Appendix D (Control of Fluxes)

contributor authorIPC - Association Connecting Electronics Industries
date accessioned2017-09-04T18:15:10Z
date available2017-09-04T18:15:10Z
date copyright35339
date issued1996
identifier otherHJJFCAAAAAAAAAAA.pdf
identifier urihttps://lib.yabesh.ir/std/handle/yse/198042
description abstractDuring the kickoff meeting at San Diego for this task group (5/l/95), a vote was taken to determine if the attendees (some 26 members of industry) felt that a revision to the existing appendix D was needed. The group voted unanimously that a revision was required. The two major areas of complaint were: a) there were concerns regarding the lack of a ‘‘uniform'' approach made the testing more costly and delayed implementation for both users and suppliers; and b) the test method didn't address all assembly methods (e.g. ‘‘chip and DIP'' and ‘‘PTH only''). It is the intent of this revision to correct these problems.
languageEnglish
titleIPC TR-467num
titleSupporting Data and Numerical Examples for ANSI/J-STD-001B: Appendix D (Control of Fluxes)en
typestandard
page22
statusActive
treeIPC - Association Connecting Electronics Industries:;1996
contenttypefulltext


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