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IPC TM-650 2.4.36C

Rework Simulation, Plated-Through Holes for Leaded Components

Organization:
IPC - Association Connecting Electronics Industries
Year: 2004

Abstract: This test method is used to simulate the procedures for plated-through hole (PTH) component removal and replacement, in order to determine the effects of rework on the quality and integrity of the PTH barrel and conductor foil on bare rigid or flexible printed boards. The five steps are designed to simulate initial soldering after a preconditioning bake and two subsequent replacements.
URI: https://lib.yabesh.ir/std/handle/yse/195478
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    IPC TM-650 2.4.36C

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contributor authorIPC - Association Connecting Electronics Industries
date accessioned2017-09-04T18:12:29Z
date available2017-09-04T18:12:29Z
date copyright05/01/2004
date issued2004
identifier otherHCPHFBAAAAAAAAAA.pdf
identifier urihttps://lib.yabesh.ir/std/handle/yse/195478
description abstractThis test method is used to simulate the procedures for plated-through hole (PTH) component removal and replacement, in order to determine the effects of rework on the quality and integrity of the PTH barrel and conductor foil on bare rigid or flexible printed boards. The five steps are designed to simulate initial soldering after a preconditioning bake and two subsequent replacements.
languageEnglish
titleIPC TM-650 2.4.36Cnum
titleRework Simulation, Plated-Through Holes for Leaded Componentsen
typestandard
page2
statusActive
treeIPC - Association Connecting Electronics Industries:;2004
contenttypefulltext
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