درباره ما
IEEE/VITA Standard for Reliability Component Stress Analysis and Derating Specification
IEEE Std 2818-2024/VITA 51.4-2024
Year: 2025
IEEE - The Institute of Electrical and Electronics Engineers, Inc.
Abstract: This document describes an open standard for parts stress analysis and derating. It establishes uniform methods to increase a component’s reliability margin by decreasing the amount of applied stress (i.e., voltage, current, temperature, power, etc.) to an electronic, electrical, or electromechanical part. Reducing the stress levels improves device reliability/durability by reducing failure rates, thereby improving the reliability and availability of the product.
Subject: reliability
-
Statistics
IEEE/VITA Standard for Reliability Component Stress Analysis and Derating Specification
Show full item record
| contributor author | IEEE - The Institute of Electrical and Electronics Engineers, Inc. | |
| date accessioned | 2025-09-30T23:08:28Z | |
| date available | 2025-09-30T23:08:28Z | |
| date copyright | 15 May 2025 | |
| date issued | 2025 | |
| identifier other | 11004573.pdf | |
| identifier uri | https://lib.yabesh.ir/std/handle/yse/348581 | |
| description abstract | This document describes an open standard for parts stress analysis and derating. It establishes uniform methods to increase a component’s reliability margin by decreasing the amount of applied stress (i.e., voltage, current, temperature, power, etc.) to an electronic, electrical, or electromechanical part. Reducing the stress levels improves device reliability/durability by reducing failure rates, thereby improving the reliability and availability of the product. | |
| language | English | |
| publisher | IEEE - The Institute of Electrical and Electronics Engineers, Inc. | |
| title | IEEE/VITA Standard for Reliability Component Stress Analysis and Derating Specification | en |
| title | IEEE Std 2818-2024/VITA 51.4-2024 | num |
| type | standard | |
| page | 35 | |
| tree | IEEE - The Institute of Electrical and Electronics Engineers, Inc.:;2025 | |
| contenttype | fulltext | |
| subject keywords | reliability | |
| subject keywords | VITA 51.4 | |
| subject keywords | derating | |
| subject keywords | IEEE 2818™ | |
| subject keywords | environmental stress | |
| subject keywords | electrical stress | |
| identifier DOI | 10.1109/IEEESTD.2025.11004573 |