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JEDEC JESD24-4
Thermal Impedance Measurements for Bipolar Transistors (Delta Base- Emitter Voltage Method) - Addendum to JEDEC JESD 24
Organization:
JEDEC - Solid State Technology Association
Year: 2002
Abstract: The purpose of this test method is to measure the thermal impedance of the Bipolar Transistor under the specified conditions of applied voltage, current and pulse duration. The temperature sensitivity of the base-emitter voltage is used as the junction temperature indicator. This test method is used to measure the thermal response of the junction to a heating pulse. Specifically, the test may be used to measure dc thermal resistance, and to ensure proper die mountdown to its case. This is accomplished through the appropriate choice of pulse duration and heating power magnitude.
Subject: Bipolar Transistors
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| contributor author | JEDEC - Solid State Technology Association | |
| date accessioned | 2017-09-04T18:26:32Z | |
| date available | 2017-09-04T18:26:32Z | |
| date copyright | 11/01/1990 (R 2002) | |
| date issued | 2002 | |
| identifier other | ILTZJBAAAAAAAAAA.pdf | |
| identifier uri | https://lib.yabesh.ir/std/handle/yse/208746 | |
| description abstract | The purpose of this test method is to measure the thermal impedance of the Bipolar Transistor under the specified conditions of applied voltage, current and pulse duration. The temperature sensitivity of the base-emitter voltage is used as the junction temperature indicator. This test method is used to measure the thermal response of the junction to a heating pulse. Specifically, the test may be used to measure dc thermal resistance, and to ensure proper die mountdown to its case. This is accomplished through the appropriate choice of pulse duration and heating power magnitude. | |
| language | English | |
| title | JEDEC JESD24-4 | num |
| title | Thermal Impedance Measurements for Bipolar Transistors (Delta Base- Emitter Voltage Method) - Addendum to JEDEC JESD 24 | en |
| type | standard | |
| page | 18 | |
| status | Active | |
| tree | JEDEC - Solid State Technology Association:;2002 | |
| contenttype | fulltext | |
| subject keywords | Bipolar Transistors | |
| subject keywords | Delta Base-Emitter Voltage Method | |
| subject keywords | Thermal Impedance Measurements - Bipolar Transistors |