Now showing items 321-340 of 793

    • IPC D-356B 

      Type: standard
      Source: IPC - Association Connecting Electronics Industries:;2002
      Organization : IPC - Association Connecting Electronics Industries
      Abstract: SCOPE AND OBJECTIVE
      This standard describes a data format for transmitting bare board electrical test information. The material contained herein is intended to convey requirements, guidelines, and ...
    • IPC A-600H SWEDISH 

      Type: standard
      Source: IPC - Association Connecting Electronics Industries:;2010
      Organization : IPC - Association Connecting Electronics Industries
      Abstract: This document describes the preferred, acceptable, and non-conforming conditions that are either externally or internally observable on printed boards. It represents the visual interpretation of minimum requirements set ...
    • IPC TM-650 2.4.9D 

      Type: standard
      Source: IPC - Association Connecting Electronics Industries:;1988
      Organization : IPC - Association Connecting Electronics Industries
      Abstract: This test method defines the procedure for determining the bond strength of copper foil clad flexible dielectric material.
    • IPC IPC/JEDEC J-STD-033C CHINESE 

      Type: standard
      Source: IPC - Association Connecting Electronics Industries:;2013
      Organization : IPC - Association Connecting Electronics Industries
    • IPC TM-650 2.4.24.6 

      Type: standard
      Source: IPC - Association Connecting Electronics Industries:;2006
      Organization : IPC - Association Connecting Electronics Industries
      Abstract: This test method establishes a procedure for determining the thermal decomposition temperature (Td) of base laminate materials using thermogravimetric analysis (TGA). Use of this test method for printed wiring boards or ...
    • IPC TM-650 2.5.33.3 

      Type: standard
      Source: IPC - Association Connecting Electronics Industries:;1998
      Organization : IPC - Association Connecting Electronics Industries
      Abstract: This test method measures DC and AC current leakage from the tip of the Unit Under Test (UUT) to ground. The AC frequency range measured is in the 20 Hz to 20 MHz range, which covers the currently known equipment base. If ...
    • IPC TM-650 2.4.2A 

      Type: standard
      Source: IPC - Association Connecting Electronics Industries:;1976
      Organization : IPC - Association Connecting Electronics Industries
      Abstract: Ductility values are determined by measuring the bulge height on a Mullen bulge tester or equivalent. Measurements are made in mm.
    • IPC J-STD-001E 

      Type: standard
      Source: IPC - Association Connecting Electronics Industries:;2010
      Organization : IPC - Association Connecting Electronics Industries
      Abstract: This standard prescribes practices and requirements for the manufacture of soldered electrical and electronic assemblies. Historically, electronic assembly (soldering) standards contained a more comprehensive tutorial ...
    • IPC IPC/EIA J-STD-026 

      Type: standard
      Source: IPC - Association Connecting Electronics Industries:;1999
      Organization : IPC - Association Connecting Electronics Industries
      Abstract: This standard addresses semiconductor chip design. It is intended for applications utilizing standard substrates, materials, assembly, and test methods as well as established semiconductor fabrication and bumping processes. ...
    • IPC TM-650 2.2.6A 

      Type: standard
      Source: IPC - Association Connecting Electronics Industries:;1997
      Organization : IPC - Association Connecting Electronics Industries
      Abstract: To measure the inside diameter of drilled through-holes in printed wiring boards, either in process or end product.
    • IPC 6015 

      Type: standard
      Source: IPC - Association Connecting Electronics Industries:;1998
      Organization : IPC - Association Connecting Electronics Industries
      Abstract: This specification establishes the specific requirements for the organic mounting structure used to interconnect chip components, which in combination form the completed functional Organic Single-chip Module (SCM-L) or ...
    • IPC TM-650 2.3.31 

      Type: standard
      Source: IPC - Association Connecting Electronics Industries:;1988
      Organization : IPC - Association Connecting Electronics Industries
      Abstract: This test method is designed to determine relative degree of cure in liquid U.V. curable materials such as etch resists, plating resists and solder masks. It is not applicable to dry film products nor to solvent-based ...
    • IPC TR-462 

      Type: standard
      Source: IPC - Association Connecting Electronics Industries:;1987
      Organization : IPC - Association Connecting Electronics Industries
      Abstract: The Round Robin Test Program had the following objectives. Determine the effectiveness of different protective coatings, and methods of coating application, on printed wiring boards. Coatings were to be applied over a ...
    • IPC TR-579 

      Type: standard
      Source: IPC - Association Connecting Electronics Industries:;1988
      Organization : IPC - Association Connecting Electronics Industries
      Abstract: Objective
      The "Round Robin Reliability Evaluation of Small Diameter Plated Through Holes (PTH) in Printed Wiring Boards" had the following objectives:
      • Evaluate the performance of small ...
    • IPC IPC/JEDEC J-STD-033C 

      Type: standard
      Source: IPC - Association Connecting Electronics Industries:;2012
      Organization : IPC - Association Connecting Electronics Industries
      Abstract: This standard applies to all devices subjected to bulk solder reflow processes during PCB assembly, including plastic encapsulated packages, process sensitive devices, and other moisture sensitive devices made with ...
    • IPC SM-780 

      Type: standard
      Source: IPC - Association Connecting Electronics Industries:;1988
      Organization : IPC - Association Connecting Electronics Industries
      Abstract: This document provides guidelines for surface mounting electronic parts, and for intermixing surface and through-the-board mounting techniques. In addition, it describes the types of materials and interconnection substrates ...
    • IPC J-STD-001ES 

      Type: standard
      Source: IPC - Association Connecting Electronics Industries:;2010
      Organization : IPC - Association Connecting Electronics Industries
      Abstract: This Addendum provides requirements to be used in addition to, and in some cases, in place of, those published in IPC J-STD-001E to ensure the reliability of soldered electrical and electronic assemblies that must survive ...
    • IPC TM-650 2.4.51 

      Type: standard
      Source: IPC - Association Connecting Electronics Industries:;1995
      Organization : IPC - Association Connecting Electronics Industries
      Abstract: To determine dispersion of glass microbeads in Self Shimming Thermally Conductive Adhesives, thus ensuring the proper self-induced gap. It is important for the beads to be well dispersed throughout the batch, since this ...
    • IPC 2615 

      Type: standard
      Source: IPC - Association Connecting Electronics Industries:;2000
      Organization : IPC - Association Connecting Electronics Industries
      Abstract: This Standard covers dimensioning and tolerancing of electronic packaging as it relates to printed boards and the assembly of printed boards. The concepts defined in this Standard are derived from ASME Y14.5M-1994. Printed ...
    • IPC TM-650 2.4.41.1A 

      Type: standard
      Source: IPC - Association Connecting Electronics Industries:;1997
      Organization : IPC - Association Connecting Electronics Industries
      Abstract: To describe the vitreous silica dilatometer method for determining the linear thermal expansion of laminated materials within the temperature range of –55°C to 100°C. Inorganic substrates (non-laminated) ...